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Home -> Products -> Wafer Inspection Systems -> Wafer Inspection System MX61 & MX61L
Wafer Inspection Systems:
Introduction
Wafer Inspection System MX61A
Wafer Inspection System MX61 & MX61L
Wafer Inspection System MX51
Wafer Inspection Systems AL110 Autoloaders
Wafer Inspection System MX61 & MX61L
MX61/MX61L - Upright semiconductor inspection microscopes

With our long experience in the fields of industry and material science, Olympus provides many clear-cut solutions making electronic device inspections easier, quicker and more efficient.
The MX61/MX61L semiconductor inspection microscopes have been developed specifically to meet the demands of wafer inspection. These user-friendly microscopes allow operators to work in an ergonomically correct position and benefit from smoother operation throughout extended inspection periods. Productivity and integration of the instruments into the work area are, thereby, maximised.

Models

MX61: 6" and 8" wafer inspection

MX61L: 300mm wafer inspection

Olympus MX microscopes benefit every customer right from the start --- meeting their needs in full, without wasting time or money.

 - Fast startup
 - Easy operation
 - Failure analysis
 - Future expandability
Features & Benefits Accessories Dimensions Specifications Brochures Peripherals
Specifications

Model

MX61

MX61L

Optical
system
UIS (Universal Infinity System)
Microscope
Stand
Reflected light illumination (F.N.26.5)
12v, 100W halogen lamp (pre-centering type)
Brightfield/darkfield mirror plus 1 cube (option), exchange method
Built-in motorized aperture diaphragm
(Pre-setting for each objective, automatically open for darkfield observation)

Transmitted light illumination*(F.N.26.5)
*When transmitted illumination unit MX-TILLA or MX-TILLB is combined.
Illumination by light source LG-PS2 and light guide LG-SF (12V, 100W halogen lamp) or their equivalent.

1)MX-TILLA: condenser (N.A.0.5), with aperture stop
2)MX-TILLB: condenser (N.A.0.6), with aperture stop and field stop

Observation methods
1)Reflected light brightfield, 2)Reflected light darkfield, 3)Reflected light Nomarski DIC, 4)Reflected light simple polarizing, 5)Reflected light fluorescence, 6)Reflected light infrared (IR), 7)Transmitted light brightfield, 8)Transmitted light simple polarizing

*Separate (optional) cubes are required for No.3, 4 and 5.
*No.7 and 8 require combination with a transmitted illumination unit.
Nosepiece1)Motorized sextuple revolving nosepiece
   with slider slot for DIC: U-D6REMC
2)Motorized quintuple BD revolving nosepiece
   with slider slot for DIC: U-D5BDREMC
3)Motorized centerable quintuple revolving nosepiece
   with slider slot for DIC: U-P5REMC
Forward rotation by objective exchange button on the front panel of microscope, or directly by hand switch U-HSTR2 (user designation)
Observation
tube
1)Super widefield erect image tilting trinocular tube (F.N.26.5): MX-SWETTR
2)Others: Super widefield trinocular tube/Widefield binocular tube
Super widefield erect image tilting trinocular tube (F.N.26.5): MX-SWETTR or U-SWETTR
(MX-SWETTR is equipped for MX61L as standard.)
Stage
1)MX-SIC8R 8"x8" stage
Stroke: 210x210mm
(Transmitted light illumination area: 189x189mm)

2)MX-SIC6R2 6"x6" stage
Stroke: 158x158mm
(Reflected light use only)
MX-SIC1412R2 14"x12" stage      
Stroke: 356x305mm
(Transmitted light illumination area: 356x284mm)
combination with MX-TILLB


Roller guide slide mechanism, belt drive system (no rack), grip clutch function (belt drive disengagement system)
Dimensions/
weight
Dimensions: approx. 509(W) x 843(D) x 507(h)mm
Weight: approx. 40kg
(microscope stand only approx. 27kg)
Dimensions: approx. 710(W) x 843(D) x 507(h)mm
Weight: approx. 51kg
(microscope stand only approx. 31kg)
Electric
system
Built-in reflected light source body 100-120V/220-240V, 1.9/0.9A, 50/60Hz
Transmitted light source (LG-PS2) 100-120/220-240V, 3.0/1.8A, 50/60Hz

For your Industrial Micro-Imaging requirements in North America, please call our Customer Sevices Team to arrange an on-site demonstration, ask for more information at: 866-629-2450 (toll free), or complete the
on-line inquiry form
.
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