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The Olympus MX51 Effect:
More Efficient Inspections Throughout Industry.
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The Olympus MX51 industrial inspection microscope is optimized for the inspection
requirements of a variety of electronic components including semiconductor wafer
inspection. Its compact size, ease of operation, 6"x6" stage travel and cost effectiveness
make the MX51 an ideal inspection microscope offering superb operational versatility.
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Features & Benefits |
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Two stage sizes are available, 150mm and 100mm.
The 150mm stage has a built-in clutch lever, which enable quick location of specimens
on the stage without diverting the operator’s view, allowing quick, easy inspections.
Control for focusing and light intensity adjustment are placed closer together,
so that both can be operated with one and the same hand. |
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MX51 can be equipped with a range of motorized nosepieces. The external handset
allows direct selection of the desired objectives. The MX51 also offers a centerable,
motorized nosepiece for accurate positioning for easy observation at high magnifications. |
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The frame and 6-inch stage are coated to prevent static build-up. *Use special metal
plate (BH3-SP6).
The standard sample thickness is 30mm. Insert the intermediate attachment to accommodate
thicker samples. |
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Fast, accurate detection of defects, and hence fewer check failures, are ensured
by the MX51’s enhanced brightfield and darkfield observation capabilities,
which deliver approximately 4* times greater detection sensitivity than previous
model.
*In the recommended set of objective lens. |
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For your Industrial Micro-Imaging requirements in North America, please
call our Customer Sevices Team to arrange an on-site demonstration, ask
for more information at: 866-629-2450 (toll free),
or complete the
on-line inquiry form.
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