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The AL Series programmable wafer handlers are cost-effective and versatile, making them
the clear choice when a programmable wafer handler is required to improve throughput.
With a diversity of inspection modes, such as sequential sampling and micro/macro
inspection of both front and back surfaces (including the ability to macro inspect
the entire back surface of the wafer from 90° to 160°), the AL wafer handling systems
are a reliable and efficient choice.
A wide array of standard features include MX51/MX61/MX61L/MX80 integration, programmable
inspection modes, non-contact wafer alignment, self-diagnostics and a stainless
steel body for clean room compatibility. |
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For your Industrial Micro-Imaging requirements in North America, please
call our Customer Sevices Team to arrange an on-site demonstration, ask
for more information at: 866-629-2450 (toll free),
or complete the
on-line inquiry form.
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