IR Laser Confocal Microscopy: Bridging the gap between SEM and optical microscopy

The LEXT OLS-3000IR is our new near-IR laser based confocal microscope for nondestructive interior observation of silicon wafers, IC chips, MEMS and other devices. Packaging technology of semiconductor devices is rapidly advancing along with the increase in the need for thinner and smaller electronics devices.  Using an infrared microscope, the LEXT OLS3000IR enables features that cannot be seen visually -- such as SIP (System in Package), 3-dimensional mounting, and CSP (Chip Scale Package) -- to be inspected, measured and analyzed nondestructively.

Ultra-fine subsurface resolution and clarity like a SEM. Fast, efficient and easy-to-use like an optical microscope. Our LEXT OLS3000IR is the best of both worlds.