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Home -> Products -> Confocal Microscopes -> OLS3000-IR
Confocal Microscopes:
Introduction
LEXT OLS3100
OLS3000-IR
OLS3000-IR

IR Laser Confocal Microscopy: Bridging the gap between SEM and optical microscopy

The LEXT OLS-3000IR is our new near-IR laser based confocal microscope for nondestructive interior observation of silicon wafers, IC chips, MEMS and other devices. Packaging technology of semiconductor devices is rapidly advancing along with the increase in the need for thinner and smaller electronics devices.  Using an infrared microscope, the LEXT OLS3000IR enables features that cannot be seen visually -- such as SIP (System in Package), 3-dimensional mounting, and CSP (Chip Scale Package) -- to be inspected, measured and analyzed nondestructively.

Ultra-fine subsurface resolution and clarity like a SEM. Fast, efficient and easy-to-use like an optical microscope. Our LEXT OLS3000IR is the best of both worlds.   

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Features & Benefits

This new laser scanning confocal technology is designed for applications requiring ultra-precise measurement and observation.  The new technology, introduced in the OLS3000IR LEXT micro-imaging system, features sub-micron imaging with outstanding resolution and accurate three-dimensional measurement capability.  

The LEXT-IR provides:

  • Both 3D observation and measurement in real time
  • Resolution of 0.55um line and space patterns
  • Z accuracy measurement of 3 =0.10+0.002L.
  • Magnification from 120x to 12,960x, ideal for the continued reduction in feature sizes
  • No expensive and destructive sample preparation -- just place sample directly on stage with no vacuum pump-down
  • Fast measurement and observation tasks in high volume manufacturing applications

LEXT OLS3000IR provides the ability to measure and observe wafer thickness on SOI wafers, Z measurement of gap, AuAl analysis at bonding pads, pattern defects, delamination between silicon and resin, alignment offsets between chip and interposer, and more. Our new LEXT microscopes enable every user to make quicker, more accurate sample analyses, all based on strict traceability systems.  




 

For your Industrial Micro-Imaging requirements in North America, please call our Customer Sevices Team to arrange an on-site demonstration, ask for more information at: 866-629-2450 (toll free), or complete the
on-line inquiry form
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