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| Laser scanning confocal microscope offers high-resolution 3D observation and measurement ... in real time. |
| MEMS technology, advanced materials processing, and nano-scale production all require remarkably precise, high resolution microscopic inspection and measurement. To meet our customers’ demands for faster performance, easier operation and greater accuracy, Olympus Micro-Imaging has developed LEXT – a new confocal laser scanning microscope for ultra-precise measurement and observation with the highest levels of reliability. No vacuum pumpdown or sample preparation is required – samples can be placed directly on the microscope stage as they are. Both 3D observation and high-precision 3D measurement are possible in real time. And because our LEXT microscope uses a laser for pinpoint surface profile measurements, you can achieve unparalleled precision and resolution. With much higher resolution than conventional optical microscopes but just as many different observation methods, LEXT microscopes enable every user to make quicker, more accurate sample analyses, all based on strict traceability systems.
LEXT – ideal for next-generation micro fabrication devices like MEMS, for new materials development, and for today’s thinner devices, with more compact surface mounting requirements.
LEXT OLS3100 : Designed for sub-micron imaging, with outstanding 0.12um and 0.01 um Z resolution and accurate three-dimensional measurement capability this microscope satisfies the needs of researchers working between the limits of conventional optical microscopes and scanning electron microscopes (SEMs). |
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LEXT OLS3000-IR: Olympus’ new near-IR laser based confocal microscope for nondestructive interior observation of silicon wafers, IC chips, MEMS and other devices. Inspection and measurements can be analyzed nondestructively.
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For your Industrial Micro-Imaging requirements in North America, please call our Customer Sevices Team to arrange an on-site demonstration, ask for more information at: 866-629-2450 (toll free), or complete the
on-line inquiry form.
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