Your Vision, Our Future
Olympus Your Vision, Our Future
Global Site
company news & events products applications application advice how to buy support contact us site map
Home -> Products -> Confocal Microscopes -> LEXT OLS3100
Confocal Microscopes:
Introduction
LEXT OLS3100
OLS3000-IR
LEXT OLS3100
Olympus Industrial America has launched LEXT, a new Confocal Laser Scanning Microscope designed for sub-micron imaging, with outstanding 0.12um resolution and accurate three-dimensional measurement capability. Magnification power from 120x to 14,400x satisfies the needs of researchers working between the limits of conventional optical microscopes and scanning electron microscopes (SEMs).
Features & Benefits Accessories Dimensions Specifications Optics Brochures Peripherals
Optics
Focus on resolution

The sophisticated optical system specially-developed by Olympus for operation at 408nm provides outstanding image resolution by minimizing the aberrations associated with short wavelength illumination and maximizing the 408nm light source performance. Resolving power is enhanced by confocal optics featuring an additional, optimized circular pinhole and a high speed XY scanner developed from Olympus MEMS technology. The result is world-leading plane resolution which clearly resolves 0.12um line and space patterns of 0.01um height, for ultra-precise measurement of micro fabrication surfaces.

              

408nm UV optical system


2-dimensional scanner (conceptual illustration)

For your Industrial Micro-Imaging requirements in North America, please call our Customer Sevices Team to arrange an on-site demonstration, ask for more information at: 866-629-2450 (toll free), or complete the
on-line inquiry form.
Copyright Olympus Industrial America Inc Terms Privacy