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Olympus Industrial America has launched LEXT, a new Confocal Laser Scanning Microscope designed for sub-micron imaging, with outstanding 0.12um resolution and accurate three-dimensional measurement capability. Magnification power from 120x to 14,400x satisfies the needs of researchers working between the limits of conventional optical microscopes and scanning electron microscopes (SEMs). |
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1. Conventional optical microscope capabilities
Like optical microscopes, operating LEXT requires no special knowledge - the image is visible as soon as the specimen is in place, allowing anyone to perform observation and measurement quickly and easily. Familiar optical microscope capabilities such as brightfield, darkfield and Nomarski DIC observation are provided, so even the slightest damage or defect can be detected instantly. |   
(Brightfield) (Darkfield) (Nomarski DIC)
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2. Motorized stage (OLS30-CS150AS) --- for fast, accurate throughput
| Tiling function enable wider image acquisition area and measurement
The tiling function allows multiple images to be brought together in a single composite image, enlarging the total observation area to a maximum of 12.8X12.8mm, and enabling quick accurate image measurement. Image capturing procedures are set out in recipe form, making work faster and more efficient. |  |
Continuous measurements of multiple points
Continuous, automatic capture of registered positions on the sample is possible under the same conditions to be taken and recorded automatically. |  |
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For your Industrial Micro-Imaging requirements in North America, please call our Customer Sevices Team to arrange an on-site demonstration, ask for more information at: 866-629-2450 (toll free), or complete the
on-line inquiry form.
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